Skip to main content Opening Fred Bijkerk, University of TwenteKeynote talk: Multilayer X-ray Optics, Past and Future Eberhard Spiller Invited: Multi-parameter Characterization of sub-nanometer Cr/Sc Multilayers based on Complementary Measurements Anton Haase, PTB Reconstruction of interfaces of periodic multilayer structures using model independent GIXR and XSW techniquesIgor Makhotkin , University of Twente X-ray at-wavelength metrology of multi-layered surfaces Sébastien Bérujon, ESRFSelf-consistent optical-constants of materials for EUV multilayer coatings Juan Larruquert , Instituto de Optica-CSICInvited: DFT simul ations of surfaces, interfaces and multilayers Peter Blaha , Inst. Materialchemie, TU Wien Beryllium based multilayer mirrors for the EUV spectral range Vladimir Polkovnikov , Institute for Physics of Microstructures RASTungsten growth on silicon oxide and boron carbide and additional role of spacer in the ultrashort period multilayer X-ray mirrors Matej Jergel , Institute of Physics SAS, SlovakiaNormal- and grazing incidence mirrors for 6.x nm wavelength Dmitry Kuznetsov , University of Twente Neutron multilayers Thierry Bigault , Institut Laue LangevinThe Hydrogenation Kinetics of a Magnesium Thin Film: An in-situ Neutron-Reflection and Optical-Transmission Study of a Two-Phase System Ad van Well , Delft University of TechnologyStudy of the in-plane magnetic structure of neutron polarizing multilayer mirrors Ryuji Maruyama, Japan Atomic Energy AgencyLab tour XUV Optics group University of Twente Invited: Kossel X-ray standing-waves within a Cr/B4 C/Sc multilayer excited by protons Karine Le Guen , Sorbonne Universités High reflective water window collector optics Hagen Pauer , OptiX fabCurrent achievements in thin-film fabrication at HZGMichael Störmer , Helmholtz-Zentrum Geesthacht Development of efficient and stable Al-based multilayer reflecting coatings for the EUV range Evgueni Meltchakov , Laboratoire Charles FabryInvited: EUV optics lifetime - radiation damage, contamination, and oxidation Maarten van Kampen , ASML Design, fabrication, and test of extreme ultraviolet microscope with 30-nm spatial resolution Mitsunori Toyoda , IMRAM, Tohoku UniversityHard X-ray multilayers with increased radiation resistanceMauro Prasciolu , DESY Stability issues in Pd/B4 C multilayers Christian Morawe, ESRFInvited: Optimization and application of attosecond multilayers Alexander Guggenmos , Ludwig-Maximilians-Universität München Periodic multilayers and FEL radiation Philippe Jonnard , Sorbonne UniversitésStress optimization of multilayer Laue lens coatings Stefan Braun , Fraunhofer IWS DresdenX-ray nanometer focusing at the SSRF basing on multi-layer Laue lens Jiayi Zhang , Beijing Synchrotron Radiation FacilityStructural and reflective characteristics of Mo/Be multilayer with barrier layers Nikolai Chkhalo , Institute for Physics of Microstructures RASWerner Jark , Elettra – Sincrotrone TriesteAccurate computation of the X-ray diffraction efficiency of a multilayer coated grating based on a non-conformal deposition model Francois Polack , Synchrotron SOLEILHigh Efficiency Multilayer coated Blazed Grating for tender X-rays Andrey Sokolov , Helmholtz Zentrum Berlin
