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MESA+
MESA+ Institute
Nanolab
Analysis
Analysis Equipment
en
Nederlands
English
UT
MESA+
MESA+ Institute
Nanolab
Analysis
Analysis Equipment
Equipment
Advanced instruments to perform surface- and bulk analysis and high-resolution imaging on a variety of materials.
SURFACE ANALYSIS, IMAGING AND SAMPLE CREATION
SEM: ZEISS Merlin
High resolution scanning electron microscope
TEM: Thermo Scientific Spectra 300
Probe corrected S/TEM for Materials Science
FIB: Thermo Scientific Helios 5 UX
DualBeam Focused Ion Beam
XPS: PHI Quantes
Dual scanning x-ray photoelectron microprobe
XRD: Bruker D8 DISCOVER
Scanning XRD with beam size of nominal 20-30 micrometers
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