MESA+ XPS

PHI Quantes Dual Scanning X-ray Photoelectron Microprobe

PHI Quantes Dual Scanning X-ray Photoelectron Microprobe is the new XPS at MESA+ NanoLab. It is a unique dual monochromator scanning X-ray Photoelectron microprobe that combines a high energy (HAXPES) monochromatic x-ray source (Cr Kα) with a conventional monochromatic soft x-ray (Al Kα). This state-of-the-art XPS instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. With a dual-source ion gun it can be used for gentle surface cleaning as well as depth profiling with little to no chemical damage for inorganic and organic materials.


CONTACT: 

YOU CAN FIND THE XPS IN NANOLAB NL1.029