Thermo Scientific Spectra300 Scanning TEM with probe corrector
The Thermo Scientific probe corrected Spectra300 is the new (S)TEM at MESA+ NanoLab. With a spatial resolution of 50 pm or better, and several exciting advanced options, this microscope will elevate S/TEM analysis to a whole new level.
The installation of the Spectra300 started last Summer and was finalised with the acceptance last February. Although the S/TEM has operational status, it is however not fully ready for use. It is anticipated that we can handle TEM analysis requests in the course of upcoming Spring. More advanced STEM analysis options will be possible in the course of the rest of the Year in a step by step way. We will keep you updated on this webpage. For further information, please contact:
YOU CAN FIND THE TEM IN NANOLAB NL1.048
Applications
specimen preparation 2Specimen preparation aspects of samples, composed of materials with very different properties, for cross-sectional TEM (XTEM) observation. Example: Dimple Grinding/Polishing and Argon ion milling as applied to a brittle magnetic thin film on a flexible plastic tape.
XTEMXTEM analysis of porous anodic aluminium oxide films with columnar structure.
BlistersObservation of blisters, the importance of specimen thickness to allow XTEM viewing of the fully intact hemispherical blister dome.
XTEM on thick samplesLarge field of view XTEM analysis of piezoelectric material. Challenging or piece of a cake? In this example is shown how the method of Dimple Grinding/Polishing and argon ion etching compares with Focus Ion Beam to prepare specimen composed of a very thick film of piezoelectric material, several micrometers thick, on an electrically non-conductive substrate.
