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See Analysis

Equipment

Advanced instruments to perform surface- and bulk analysis and high resolution imaging on a variety of materials.

SURFACE ANALYSIS, IMAGING AND SAMPLE CREATION

  • FIB: FEI NOVA 600
    dual beam focused ion beam
  • SEM: ZEISS MERLIN
    high resolution scanning electron microscope
  • TEM: PHILIPS CM300ST-FEG
    analytical 300 kV transmission electron microscope
  • XPS: PHYSICAL ELECTRONICS PHI QUANTERA
    scanning microprobe x-ray photoelectron spectrometer
  • XRD: BRUKER D8 DISCOVER
    scanning XRD with beam size of nominal 20-30 micrometers
  1. Home MESA+ Institute
  2. Infrastructure
  3. Nanolab
  4. Analysis
  5. Analysis Equipment
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MESA+ Institute
NanoLab Building (entrance through Hal B)
Hallenweg 15, 7522 NH Enschede
+31 53 489 2715
mesaplus@utwente.nl
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