Equipment

Advanced instruments to perform surface- and bulk analysis and high resolution imaging on a variety of materials.

SURFACE ANALYSIS, IMAGING AND SAMPLE CREATION

FIB: FEI NOVA 600

dual beam focused ion beam

SEM: ZEISS MERLIN

high resolution scanning electron microscope

TEM: PHILIPS CM300ST-FEG

analytical 300 kV transmission electron microscope

XPS: PHYSICAL ELECTRONICS PHI QUANTERA

scanning microprobe x-ray photoelectron spectrometer

XRD: BRUKER D8 DISCOVER

scanning XRD with beam size of nominal 20-30 micrometers