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Analysis Equipment
FIB
SEM
TEM
XPS
XRD
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Analysis Equipment
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Equipment
Advanced instruments to perform surface- and bulk analysis and high resolution imaging on a variety of materials.
SURFACE ANALYSIS, IMAGING AND SAMPLE CREATION
FIB: FEI NOVA 600
dual beam focused ion beam
SEM: ZEISS MERLIN
high resolution scanning electron microscope
TEM: PHILIPS CM300ST-FEG
analytical 300 kV transmission electron microscope
XPS: PHYSICAL ELECTRONICS PHI QUANTERA
scanning microprobe x-ray photoelectron spectrometer
XRD: BRUKER D8 DISCOVER
scanning XRD with beam size of nominal 20-30 micrometers
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