Cutting-edge research in thin films and multilayers for EUV and Xray published in Journal of Applied Physics, American Chemical Society and in VacuumIt’s not often that we can celebrate 3 publications at once! Dennis IJpes, Abdul Rehman and Fedor Akhmetov, PhD students of the Industrial Focus Group XUV Optics (XUV; Faculty of TNW/MESA+/NEM Cluster) all published papers recently - in the Journal of Applied Physics, American Chemical Society and in Vacuum. In addition, Dennis will defend his thesis ‘Interface engineered ultrashort period soft X-ray multilayers’ on December 13th 2023. A great success for all (co-)authors involved!Read more
Marko Sturm presents as invited speaker on the 69th AVSMarko Sturm presented an invited talk titled ‘Probing thin film interfaces at the nanoscale by Low Energy Ion Scattering’ during the 69th International Symposium & Exhibition of the American Vacuum Society (AVS) in Portland, Oregon. In his presentation, he highlighted the work by former XUV PhD student Ani Chandrasekaran on using Low Energy Ion Scattering (LEIS) for studying the growth of ultrathin transition metal films, as well as the work of current XUV PhD student Adele Valpreda on using the LEIS tail signal for measuring sharpness of thin film interfaces.Read more
Cutting-edge research in thin films and multilayers for EUV and Xray published in Journal of Applied Physics, American Chemical Society and in Vacuum
Marko Sturm presents as invited speaker on the 69th AVS- Wesley van den Beld, Michel de Jong & Jeroen Vollenbroek receive grant 'Innovate and Share it EEMCS 2023'
- XUV joining study tour of Scintilla to South-Korea
Imaging the invisible
Frank Schuurmans appointed as professor at XUV
XUV organised QUNOM workshop
Fedor Akhmetov and Ilias Gaffarov present at the SPIE Optics + Optoelectronics 2023 International Symposium
Adele Valpreda and Marko Sturm present at the LEIS workshop and COAST conference
Highly active participation rate at the NEM Cluster Day 2023
QUNOM workshop 2023 - Final program
Publication on He charge exchange processes in low-energy ion scattering
