Timur Terentev presents at European X-ray Spectrometry Conference (EXRS 2024)Read more
X-ray metrology for academia and industryThe University of Twente’s XUV Optics Research Group and Malvern Panalytical have extended their strategic collaboration. This collaboration is shaped around a joint research programme supporting the use of Malvern Panalytical’s roadmap solutions for hybrid elemental and structural characterisation of thin films in application segments including semiconductors and other advanced materials.Read more
Timur Terentev presents at European X-ray Spectrometry Conference (EXRS 2024)
X-ray metrology for academia and industry
Cross-border short wavelength nanometrology dialogue between XUV and PTB
Study tour XUV 2024
LEIS Workshop 2024
Igor Makhotkin presents on the SPIE Advanced Lithography + Patterning Conference 2024- X-rays @NWO Physics 2024
- PhD defence Valent Oldenkotte
Pushing the limits of what is physically possible
Successful Conclusion of PXRNMS 2023: Exploring Frontiers in Multilayer Research- Cutting-edge research in thin films and multilayers for EUV and Xray published in Journal of Applied Physics, American Chemical Society and in Vacuum
Marko Sturm presents as invited speaker on the 69th AVS
