Experiments ordered A-Z

Jeol Neoscope JCM 5000

NeoScope JCM-5000 bench top Scanning Electron Microscope (SEM)

Easy to use: digital camera-looking interface

Anyone can learn to use it in 30 min, even a beginner.

Compact

Image in three minutes after loading specimen

Coating not always necessary due to low vacuum observation mode.

Dimensions of main unit: 492 mm (width) x 458 mm (depth) x 434 mm (height), 63 kg


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Keywords:

SEM


Measurements:

Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects.


Specifications:

A real magnification range of 10X - 20000X

High vacuum and low vacuum modes

3 different kV presets (5, 10, 15 kV)

Sample stage allows 35 mm travel in X and Y

Maximum sample size 70 mm diameter and 50 mm thickness

Secondary and back-scatter imaging modes


Equipment:

3 piezoelectric force cells, from 4 kN to 60 kN

Measurement of the mass displacement during impact

Several plate and beam clamping devices

Data acquisition via oscilloscope and Labview


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Publications:



Location:

Westhorst WH121


Research group:

Production Technology


Contact:

Laura Vargas