Microscopy

NanoSurf easyScan 2

NanoSurf easyScan 2

•The Nanosurf easyScan 2 is an atomic force microscope that can measure the topography and several other properties with nanometer resolution

•Dual lens observation optics and automatic approach

•Cantilever Alignment Chip technology allows simple and quick tip exchange without laser adjustments

Picture

Picture

Picture


Keywords:

AFM, atomic force microscopy, surface topography, surface roughness


Measurements:

Micrography, topography, analysis of thin films or coatings, defects, roughness


Specifications:

Picture


Publications:



Location:

Westhorst WH121


Research group:

Production Technology


Contact:

Laura Vargas