Microscopy

Jeol Neoscope JCM 5000

NeoScope JCM-5000 bench top Scanning Electron Microscope (SEM)

•Easy to use: digital camera-looking interface

•Anyone can learn to use it in 30 min, even a beginner.

•Compact

•Image in three minutes after loading specimen

•Coating not always necessary due to low vacuum observation mode.

•Dimensions of main unit: 492 mm (width) x 458 mm (depth) x 434 mm (height), 63 kg


Picture

Picture

Picture


Keywords:

SEM


Measurements:

Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects.


Specifications:

•A real magnification range of 10X - 20000X

•High vacuum and low vacuum modes

•3 different kV presets (5, 10, 15 kV)

•Sample stage allows 35 mm travel in X and Y

•Maximum sample size 70 mm diameter and 50 mm thickness

•Secondary and back-scatter imaging modes


Equipment:

•3 piezoelectric force cells, from 4 kN to 60 kN

•Measurement of the mass displacement during impact

•Several plate and beam clamping devices

•Data acquisition via oscilloscope and Labview


Picture

Picture

Picture


Publications:



Location:

Westhorst WH121


Research group:

Production Technology


Contact:

Laura Vargas