NeoScope JCM-5000 bench top Scanning Electron Microscope (SEM)
•Easy to use: digital camera-looking interface
•Anyone can learn to use it in 30 min, even a beginner.
•Image in three minutes after loading specimen
•Coating not always necessary due to low vacuum observation mode.
•Dimensions of main unit: 492 mm (width) x 458 mm (depth) x 434 mm (height), 63 kg
Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects.
•A real magnification range of 10X - 20000X
•High vacuum and low vacuum modes
•3 different kV presets (5, 10, 15 kV)
•Sample stage allows 35 mm travel in X and Y
•Maximum sample size 70 mm diameter and 50 mm thickness
•Secondary and back-scatter imaging modes
•3 piezoelectric force cells, from 4 kN to 60 kN
•Measurement of the mass displacement during impact
•Several plate and beam clamping devices
•Data acquisition via oscilloscope and Labview