Jeol JSM 6400 Scanning Electron Microscope The Jeol JSM-6400 is a SEM configured with a Noran energy dispersive X-ray analyzer (EDS system). SEM is a method for high-resolution imaging of surfaces.
Micromap 512 interference microscope Roughness properties of surfaces are of importance for many tribological phenomena. The Micromap is a microscope that enables the measurement of a range of surfaces.
Micromap 560 inference microscope with automated stages Similar to the Micromap 512, the Micromap 560 is an interference microscope that enables contact-less measurement of surface micro-geometry in 3D
NanoSurf easyScan 2 The Nanosurf easyScan 2 is an atomic force microscope that can measure the topography and several other properties with nanometer resolution.