On October 5th and 6th, 2016, the 2nd edition of the X-ray metrology workshop, in short XRM, was held on the campus of University of Twente.
The goal of the workshop was to unite the different research groups exploiting x-ray analysis for various applications with the aim to exchange and share experience and technologies.
This year the workshop program had an emphasis on the application of X-ray scattering techniques used for soft condensed matter research. The aim of the workshop was to discuss laboratory and synchrotron applications of X-ray analysis techniques for material science research.
Topical lectures were held on Application of X-ray reflectivity and X-ray standing wave techniques to soft matter studies by Dr. Oleg Konovalov, ESRF; X-ray powder methods applied in the analysis of proteins by Dr. Gwilherm Nenert, PANalytical; Determination of Local Structure in Disordered Systems using SAXS by Prof. Dr. Andre ten Elshof, University of Twente; Insights in pair distribution function analysis of X-ray scattering data by Dr. Milen Gateshki, PANalytical BV. Furthermore, two in-depth invited talks were held on X-ray Source Developments by Dr. Arjan Noordermeer, PANalytical and In-situ X-ray investigation of single nanowire growth by Prof. Dr. Ullrich Pietsch, University of Siegen.
The programme included 10-minute discussions on topics formulated by student participants presenting current research challenges and receiving feedback and advise from specialists in the X-ray field. The workshop was attended by 57 participants of which 21 PhD students.
The X-ray metrology workshop was organized by Dr. I.A. Makhotkin, XUV Optics Prof. Dr. Ir. G. Koster, IMS and Dr. Saskia Lindhoud, Nanobiophysics and hosted by Prof. Dr. Fred Bijkerk, Prof. Dr. ing. Guus Rijnders and Prof. Dr. Ir. Mireille Claessens (MESA+, University of Twente). Support was given by the MESA+ Institute for Nanotechnology (University of Twente), PANalytical, the Industrial Focus Group XUV Optics (MESA+) and the Inorganic Materials Science Group (MESA+).
The XRM workshops are scheduled to be held on a bi-annual basis at different research group locations in the Netherlands, with alternately summer schools on X-ray metrology.
The workshop was sponsored by
