X-ray metrology for academia and industryThe University of Twente’s XUV Optics Research Group and Malvern Panalytical have extended their strategic collaboration. This collaboration is shaped around a joint research programme supporting the use of Malvern Panalytical’s roadmap solutions for hybrid elemental and structural characterisation of thin films in application segments including semiconductors and other advanced materials.Read more
PhD defence Jort VerbakelOn Friday September 20, Jort Verbakel will defend his thesis entitled: "Topological and optoelectronic properties of stacked two-dimensional materials".Read more
X-ray metrology for academia and industry
PhD defence Jort Verbakel
Cross-border short wavelength nanometrology dialogue between XUV and PTB
LEIS Workshop 2024
Igor Makhotkin presents on the SPIE Advanced Lithography + Patterning Conference 2024
X-rays @NWO Physics 2024
Grant for Groundbreaking Educational Innovation in Applied Physics
Prof. Dr. Claudia Filippi receives M2-NWO grant
PhD defence Valent Oldenkotte
NWO awards millions for three key technologies developed by the University of Twente
Pushing the limits of what is physically possible
Successful Conclusion of PXRNMS 2023: Exploring Frontiers in Multilayer Research