Thermo Scientific Spectra 300 Scanning TEM with probe corrector
The Thermo Scientific probe corrected Spectra 300 is the new (S)TEM at MESA+ NanoLab, and operational since February 2022. With a spatial resolution of 50 pm or better, and several exciting advanced options, this microscope will elevate S/TEM analysis to a whole new level.
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YOU CAN FIND THE TEM IN NANOLAB NL1.048
Applications
specimen preparation
TEM specimen preparation; an introduction
specimen preparation 2
Specimen preparation aspects of samples, composed of materials with very different properties, for cross-sectional TEM (XTEM) observation. Example: Dimple Grinding/Polishing and Argon ion milling as applied to a brittle magnetic thin film on a flexible plastic tape.
XTEM
XTEM analysis of porous anodic aluminium oxide films with columnar structure.
Blisters
Observation of blisters, the importance of specimen thickness to allow XTEM viewing of the fully intact hemispherical blister dome.
XTEM on thick samples
Large field of view XTEM analysis of piezoelectric material. Challenging or piece of a cake? In this example is shown how the method of Dimple Grinding/Polishing and argon ion etching compares with Focus Ion Beam to prepare specimen composed of a very thick film of piezoelectric material, several micrometers thick, on an electrically non-conductive substrate.
Surface amorphisation
Ion beam induced artifacts; damage by FIB milling
