Research

The research group XUV Optics of the Faculty Science and Technology of the University of Twente is involved in different aspects of science and technology.

Our Research themes are:

  1. Multilayer design and growth
  2. 'Advanced’ layer growth and (EUV) Plasma-driven physics and surface chemistry at elevated temperatures
  3. Transmission gratings 
  4. Piezoelectric thin films 
  5. Surface chemistry or surface interaction
  6. Xray metrology of thin films 

The research is focussed on the following activities

1. Multilayer design and growth 

We design, deposit, and characterize multilayer Bragg structures for a broad range of wavelengths. Our focus is on exploring the growth physics and atomic-scale interactions at interfaces, which determine crucial properties of the multilayers. The ultimate goal is on enhancing reflectance and thermal stability, but  also precise control of the angular and spectral response of the Bragg optics.

For more information, please contact Dr. Andrey Yakshin.

Associated assignment

Synthesis of multilayer structures with atomic scale layer thickness
Multilayer structures

2. 'Advanced’ layer growth and (EUV) plasma-driven physics and surface chemistry at elevated temperatures 

In this research theme, we investigate the advanced layer growth using PVD and CVD processes, (EUV) plasma-driven physics and (surface) chemistry at elevated temperatures for nanomaterials. This includes topics such as thin film layer growth, radical and plasma processes, development of new technology and device fabrication.

For more information, please contact Dr. Wesley van den Beld.

Associated assignments

Developing a time-dependent temperature model for thin free-standing layers during extreme ultraviolet exposure
Thin-free standing layers
Advanced transparent Optical materials (ATOM) study on enhanced entropy alloy oxidation
Optical materials study 1
Advanced transparent optical materials (ATOM) study for mosaic target depositions
Optical materials study 2

3. Transmission gratings 

In this research line, we investigate the deposition, characterization and analysis of piezoelectric thin films with a focus on exploring the structure-property relations for EUV relevant applications. Two concrete application examples that are intensively studied nowadays are adaptive EUV optics and active wafer  clamps. The overall goal is to explore the fundamental material properties to develop piezoelectric actuators which are fast, energy efficient and sub-nanometer accurate. 

For more information, please contact Dr. Muharrem Bayraktar.

Associated assignment


Spectral unraveling (SUN) of EUV light sources
EUV light sources

4. Piezoelectric THIN films 

In this research line, we investigate the deposition, characterization and analysis of piezoelectric thin films with a focus on exploring the structure-property relations for EUV relevant applications. Two concrete application examples that are intensively studied nowadays are adaptive EUV optics and active wafer  clamps. The overall goal is to explore the fundamental material properties to develop piezoelectric actuators which are fast, energy efficient and sub-nanometer accurate.

For more information, please contact Dr. Muharrem Bayraktar.

Associated assignments

Functional properties of piezoelectric thin films
Piezoelectric thin films
Deposition and analysis of piezoelectric thin films
Piezoelectric thin films 2

5. Surface chemistry or surface interaction 

In this research team we study the interaction of thin film coating materials with gases, plasma, ions and photons. We study for instance chemical modifications and morphology changes and use this knowledge to design materials and operating conditions that enhance the lifetime of optical coatings in  applications.

For more information, please contact Dr. Marko Sturm.

Associated assignments

Development and automation of an image analysis sequence for TEM micrographs
Image analysis for TEM
Detecting hydrogen from the sputterred ion signal in low-energy ion scattering
Detecting hydrogen in LEIS

6. Xray metrology of thin films 

For more information, please contact Dr. Robbert van de Kruijs.