Characterizing devices

Electrical characterization of devices in microchips is an art in itself. Taking data is easy; getting correct and meaningful information is another thing. We specialize in wafer-level electrical characterization, working with our own devices and materials from Nanolab, but also with industrial samples from R&D or mass production.

For this we share with the integrated circuit design group the Measurement Test Centre (MTC) where sophisticated equipment for various types of measurements is available.

Our range of interest includes:

  • Current-voltage and capacitance-voltage measurements
  • Very high-frequency (RF) measurements
  • Reliability testing
  • Light emission varying from infrared to visible light
  • Thermal behaviour of device properties