Characterizing devices


Electrical characterization of devices in microchips is an art in itself. Taking data is easy; getting correct and meaningful information is another thing. We specialize in wafer-level electrical characterization, working with our own devices and materials from Nanolab, but also with industrial samples from R&D or mass production.

For this we share with the Integrated Circuit Design group (ICD) the Measurement Test Centre (MTC) where sophisticated equipment for various types of measurements is available.

Our range of interest includes:

With the Mesoscale Chemical Systems (MCS) group we share an extensive MEMS test and characterization laboratory, with a.o. a Polytec MSA-600 micro system analyser and a scanning electron microscope. In the MEMS lab we can: