Analysis

Applications

For each of the analysis techniques we have written application notes

FIB,

the Machine

Focused Ion Beam

Damage control in FIB; an introduction. See also the TEM Applications web page, where this application is published as TEM APPLICATION 6.

SEM,

soil sample

Scanning Electron Microscopy

The SEM has a number of detectors capable of analysing samples in a couple of different ways.

TEM,

Co-Ti-C image

Transmission Electron Microscopy

Offers a variety of chemical analysis techniques to explore the surface and internal structure of a specimen

XPS,

fluorocarbon

mapping

X-ray Photoelectron Spectroscopy

The scanning XPS microprobe offers a couple of ways to analyse the contents of samples on a scale of 10's of micrometers.