The Analysis  Labs offers facilities for specimen preparation and a range of advanced instruments to perform surface- and bulk analysis and high resolution imaging on a variety of materials. 

FIB: FEI NOVA 600 dual beam Focused Ion Beam


 SEM: ZEISS MERLIN scanning electron microscope  


 TEM: PHILIPS CM300ST-FEG  analytical Transmission Electron Microscope 300 kV

 XPS: PHYSICAL ELECTRONICS PHI Quantera SXM - XPS system 



In our sample preparation room there are several machines that can be used to change your samples into samples that can be used in the above machines.

Within the Analysis Group at MESA+ NanoLab materials analysis is performed both for participants of MESA+ and for external clients, like external research groups and industrial partners.Analysis is restrained to materials in the solid-state and samples supplied by our clients are analyzed on their surface and internal structure using techniques like XPS (X-ray Photoelectron Spectroscopy), SEM (Scanning Electron Microscopy) and TEM (Transmission Electron Microscopy). 

The main task of the Analysis Group is focused on analysis and imaging, but also some research is carried out. This research can consist of supporting a scientist of MESA+ or result from projects in which the Analysis Group is participating. These facilities require special expertise for operation and evaluation of the experimental results.