MESA+ University of Twente
MESA+ NanoLab

Facilities

Sample Preparation Laboratory

The Analysis  Group offers facilities for specimen preparation and a range of advanced instruments to perform surface- and bulk analysis on a variety of materials. From large format saws to small format dimple grinders, there are possibilities to create specimen that can be analysed. Cutting, (vacuum)casting, grinding, polishing, cleaning, control, coating are amongst the techniques we offer to make the best possible shapes for analysis.

Available equipment

Grinder Polisher
x
Machine
Grinder Polisher Buehler Phoenix Beta
T. Buehler Phoenix Beta
Dimple Grinder
x
Machine
Dimple Grinder Gatan Model 656
T. Gatan Dimple Grinder | M. Operator: Rico Keim
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Grinder-Polisher
x
Machine
Grinder-Polisher Struers LaboPol 21
T. Labopol
Metalloplan Microscope
x
Machine
Metalloplan Microscope Leitz
T. Optical Stereo microscope
Low Speed Saw
x
Machine
Low Speed Saw Buehler Isomet
T. LS Saw
Inspection Microscope
x
Machine
Inspection Microscope Olympus SZ40
T. Stereo Zoom Microscope
Optical Microscope
x
Machine
Optical Microscope LEICA M420
T. Stereo Microscope
Precision Ion Polishing System
x
Machine
Precision Ion Polishing System Gatan Model 691
T. Polisher
Rough Cutting Saw
x
Machine
Rough Cutting Saw Struers Labotom-3
T. Saw
Sample Press
x
Machine
Sample Press Struers Primopress
T. Press
Grinder Polisher
x
Machine
Grinder Polisher Struers Tegrapol-21
T. Polisher
Turbo Coater
x
Machine
Turbo Coater BIO-RAD Polaron Division
T. Coater
Ultrasonic Cleaner
x
Machine
Ultrasonic Cleaner Branson 200
T. Cleaner
Variable Speed Grinder Polisher
x
Machine
Variable Speed Grinder Polisher Buehler Ecomet 3
T. Polisher
Precision Etching and Coating System
x
Machine
Precision Etching and Coating System Gatan Model 681
T. Coater
Advanced Plasma System
x
Machine
Advanced Plasma System Gatan Solarus Model 950
T. Cleaner
Grinder-Polisher
x
Machine
Grinder-Polisher Struers KNUTH-ROTOR 2
T. Grinder

Critical Point Dryer

Leica EM CPD 300

With a critical point dryer it is possible to dry water containing specimen in a way that they shrink almost conformal.

Critical Point Dryer

Advanced Plasma System

Gatan Solarus

Advanced plasma cleaning system for removal of hydrocarbon contamination on TEM and SEM samples. Cleaning small specimen for TEM or SEM use by a low energy H2 / O2 plasma

Advanced Plasma System

Dimple grinder

Gatan

Used to decrease the thickness of thin TEM samples. A mechanical wheel grind the thin specimen to a thickness of less than 1 um. After the use of this instrument, the ultimate thinning of the TEM specimen takes place in the precision ion polishing system

Dimple grinder

Optical microscope

Leitz Metalloplan

This wide field microscope is used to control specimen during the grinding and polishing proces.

Optical microscope

Olympus SZ40

Optical microscope with zoom objective lens 6.7 - 40x for sample inspection purposes. A ring light Olympus highlight 3100 accompanies the microscope objective. Used to view rather large specimen.

Leica M420

Macroscope for high-precision work in inspection and measurement , equipped with a camera.

Saw

Struers Labotom 3 rough cutting saw

Saw to cut small pieces out of a big piece of material. Metals of a thickness of 1 - 2 cm can be cut into smaller pieces. The smaller pieces can be cut again into even smaller pieces and if small enough they can be pressed into a sample that fits a SEM

Saw

Buehler Isomet low speed saw

Used to slice down bigger pieces of materials to quite small ones that can be used to make TEM specimen.

Sample press

Struers Primopress

Small pieces of material that need to be grinded and polished can be pressed into conducting bakelite material of a size that is suitable to handle in the grinder/polisher equipment.The product wll have diameter of 1" and a height of 2-3 cm.

Sample press

Grinder polisher

Buehler Ecomet 3

variable speed

Grinder polisher

Buehler Phoenix Beta

variable speed grinder polisher

Labopol 21

Double grinder, single speed, 250 rpm, for manual preparation of materialographic specimens.

Tegrapol 21

grinder-polisher for ultimate flatness and smoothness of SEM samples

Knuth-rotor 2

Double grinder-polisher for grinding samples with sandpaper or carbide paper

Coater

Biorad Polaron Division E6

Gold / Carbon coater for the coverage of non conducting SEM specimen with a thin layer of conducting material. The sample size can be of the order of 5x5x5 cm.

Coater

Gatan PECS

Precision Etching and Coating System. This system is used to etch or slope cut a specimen. Just like a cut that is possible with a FIB. Only this cut will be have sample size width. After cutting or stand alone a coating can be applied to the sample. Carbon / Chromium can be deposited on the samples with controlled layer thickness, down to Angstrom size. Includes a Film Thickness Monitor for accurate control of film thickness
The sample size can be around 1x1x1 cm.

Ultra sonic bath

Branson B200

For the cleaning of specimen or small instruments.The cleaner uses ultrasonic energy (40 kHz) in the form of sound waves to create millions of tiny microscopic bubbles in the solution that even works its way into holes and hidden cavities, loosening dirt on all surfaces that the solution touches. These actions, called cavitation occurs thousands of times per second to gently yet thoroughly scrub contaminations off the article being cleaned. When you lift the item out of the cleaner, it’s microscopically clean.

Ultra sonic bath