Dr. Gerrit-Jan Linker

Gerrit-Jan Linker
G. Linker (Gerrit-Jan)
Associate Scientist

University of Twente
Faculty of Science and Technology
Carre building, CR 4029
P.O. Box 217
7500 AE Enschede
The Netherlands

Education

2007-2016  Ph.D. in Theoretical Chemistry,
University of Groningen

1990-1995 drs in Theoretical Chemistry,
University of Groningen

List of Publications:

1.    G.J. Linker, P.Th van Duijnen, P.H.M. van Loosdrecht, R. Broer, "Correction to “Off-Planar Geometry and Structural Instability of EDO-TTF Explained by Using the Extended Debye Polarizability Model for Bond Angles", J.Phys.Chem. A (2022), 116 (26), 7219−7227

2.    G.J. Linker, P.Th van Duijnen, "Understanding Trends in Molecular Bond Angles", J.Phys.Chem. A (2020), 124, 7, 1306–1311

3.    G.J. Linker, thesis: "The thermal metal-insulator phase transition in (EDO-TTF)2PF6, University of Groningen (2016)

4.    G.J. Linker, P.Th. van Duijnen, P.H.M. van Loosdrecht, R.Broer, "The thermal metal-insulator phase transition in (EDO-TTF)2PF6, (2016) 115:17-18,2180-2184

5.    G.J. Linker, P.H.M van Loosdrecht, P.Th.van Duijnen, R.Broer, "Periodic Hartree-Fock and hybrid density functional calculations on the metallic and the insulating phase of (EDO-TTF)2PF6", Phys.Chem.Chem.Phys (2015), 17, 30371

6.    G.J. Linker, P.Th. van Duijnen, R.Broer, P.H.M. van Loosdrecht, "Theoretical study of the ground state of (EDO-TTF)2PF6" (2015), 1069, 105–111

7.    G.J. Linker, P.Th. van Duijnen, P.H.M. van Loosdrecht, R. Broer, "Off-Planar Geometry and Structural Instability of EDO-TTF Explained by Using the Extended Debye Polarizability Model for Bond Angles", J.Phys.Chem.A (2012), 116, 7219−7227

8.    G.J. Linker, P.H.M. van Loosdrecht, P.Th. van Duijnen, R. Broer, "Comparison of ab initio molecular properties of EDO-TTF with the properties of the (EDO-TTF) 2PF 6 crystal", Chem.Phys.Lett. (2010), 487, 220–225

9.    G.J. Linker, R. Broer, W.C. Nieuwpoort, "Hartree-Fock study on the lower excited states of a Cu+ impurity in NaF using large embedded clusters", J.Electron.Spectr.Rel.Phen. (1996), 77, 143-148