Sample Preparation Laboratory


The Analysis Group offers facilities for specimen preparation for imaging, analysis and FIB handling.
From large format saws to small format dimple grinders, there are possibilities to create specimen that can be analysed. Cutting, (vacuum)casting, grinding, polishing, cleaning, control, coating are amongst the techniques we offer to make the best possible sample conditions.

Critical Point Dryer

Advanced Plasma System

 Dimple grinder

Optical microscopes

Saws

Sample press

Grinder polisherS

CoaterS

Ultra sonic bath

You can find the sample preparation facilities in NanoLab NL1.027