See Analysis

Sample Preparation Laboratory

The Analysis Group offers facilities for specimen preparation for imaging, analysis and FIB handling

From large format saws to small format dimple grinders, there are possibilities to create specimen that can be analysed. Cutting, (vacuum)casting, grinding, polishing, cleaning, control, coating are amongst the techniques we offer to make the best possible sample conditions.

Critical Point Dryer

Advanced Plasma System

 Dimple grinder

Optical microscopes


Sample press

Grinder polisherS


Ultra sonic bath

You can find the sample preparation facilities in NanoLab NL1.027