The Analysis Group offers facilities for specimen preparation and a range of advanced instruments to perform surface- and bulk analysis and high resolution imaging on a variety of materials.
Within the Analysis Group at MESA+ NanoLab materials analysis is performed both for participants of MESA+ and for external clients, like external research groups and industrial partners. Analysis is restrained to materials in the solid-state and samples supplied by our clients are analyzed on their surface and internal structure using techniques like XPS (X-ray Photoelectron Spectroscopy), SEM (Scanning Electron Microscopy) and TEM (Transmission Electron Microscopy). Multiple detectors on the microscopes can probe many different properties of your samples. A double beam FIB (Focused Ion Beam) is used for rapid prototyping as well as sample preparation
The main task of the Analysis Group is focused on analysis and imaging, but also some research is carried out. This research can consist of supporting a scientist of MESA+ or result from projects in which the Analysis Group is participating. These facilities require special expertise for operation and evaluation of the experimental results.
You can find the Analysis Group members in NANOLAB NL1.001 or in the laboratories NL1.027 / NL1.029 / NL1.042 / NL1.048 / NL1.050