IBM Research Division, Zurich Research Laboratory, Switzerland.
Dr. Lantz received B.Sc. and M.Sc. degrees in electrical engineering from the University of Alberta, Canada, in 1991 and 1993, and a Ph.D. degree from the University of Cambridge, United Kingdom, in 1997 for work in the field of scanning probe microscopy. He then spent two years as a postdoctoral researcher at the Joint Research Center for Atom Technology in Japan, investigating the application of scanning probes in biophysics, followed by two years of research in the area of low-temperature scanning force microscopy at the Physics Institute in University of Basel, Switzerland. In 2001, he joined the Micromechanics/Nanomechanics group of the IBM Zurich Research Laboratory as a Research Staff Member. His current research activities are focused on micromechanical and nanomechanical devices and systems for scanning-probe-based data storage, tribology, and magnetic tape drive technology.