Nanoscale properties of complex oxide films
Prof. Dr. Ing. D.H.A. Blank and prof. dr. M.R. Beasley
dr. ir. G. Koster
As miniaturization continues, layers in devices are made thinner and their properties become increasingly difficult to measure. There are techniques available to measure a wide range of properties of materials at nanometer length scales and measure the extremely small signals that they produce. This thesis focusses on the use of such techniques to measure structural, stoichiometric, and magnetic properties of samples. Three different material systems will be presented, each of which zooms in on a different aspect of analysis. Their commonality is that they are oxide materials and are all in thin film form deposited on an oxide substrate.