Maurits de Jong & ……..
Transistors in complementary metal-oxide-semiconductor (CMOS) microchips are limited in lifetime due to the pile-up of atomic-scale defects occurring as a result of normal use. In the next generations of CMOS such degradation phenomena are expected to worsen. In this project we study mechanisms to repair these defects at user conditions, leading to a prolonged chip lifetime. We further pursue new material solutions for contemporary microchips that utilize self-healing mechanisms, engineered to take effect under normal user conditions. The end goal is to make a self-healing microchip.