Tuesday 28 September, 14:45 – 17:15
D01
Application of silicon micro-needles in liquid-based sensors and vapor transport
Z. Sanaee and S. Mohajerzadeh
University of Tehran, School of Electrical and Computer Eng, Nano-electronic Center of Excellence, Thin Film and Nano-Electronic Lab, Iran
D02
Metallic layer for EM pressure sensor sensitivity improvement
S. Bouaziz1,2, M. Mehdi Jatlaoui1, D. Mingli1, P. Pons1 and H. Aubert1,2
1CNRS, LAAS, Toulouse, France
2Université de Toulouse, INP, LAAS, France
D03
Microfabrication and characterization of thin-films solid-state rechargeable lithium battery
J.F. Ribeiro1, M.F. Silva1, L.M. Goncalves1, M.M. Silva2 and J. H. Correia1
1University of Minho, Algoritmi Centre, Portugal
2University of Minho, Chemistry Centre, Portugal
D04
Determination of young’s modulus of PZT – influence of cantilever orientation
H. Nazeer1, L.A. Woldering1, L. Abelmann1 and M.C. Elwenspoek1,2
1MESA+ institute for nanotechnology, University of Twente, The Netherlands
2Freiburg institute for Advanced Studies, Albert-Ludwigs-Universitat Freiburg, Germany
D05
Tungsten-siliconnitride medium for mega- to gigayear data storage
J. de Vries1, L. Abelmann1, A. Manz2 and M. Elwenspoek1,2
1MESA+ institute for nanotechnology, University of Twente, The Netherlands
2Freiburg institute for Advanced Studies, Albert-Ludwigs-Universitat Freiburg, Germany
D06
Controlled increase and stabilisation of the tuning range of RF-MEMS capacitors with an active lid electrode
J. Love1, M. Hill1 and C. O’Mahony2
1Adaptive Wireless Systems Group, Cork Institute of Technology, Ireland
2Tyndall National Institute, University College Cork, Ireland
D07
Two-degree-of-freedom capacitive MEMS velocity sensor: initial test measurements
A. Alshehri1, M. Kraft1 and P. Gardonio2
1EDS, University of Southampton, UK
2DIEGM, Università degli Studi di Udine, Italy
D08
Computational analysis of microparticle seperation in straight channels
H. Kizil1, L. Trabzon2, L. Yobas3, M. Yilmaz1 and A. Ozbey2
1Department of Materials and Metallurgical Engineering, Istanbul Technical University, Turkey
2Department of Mechanical Engineering, Istanbul Technical University, Turkey
3Department of Electronic and Computer Engineering, Hong Kong University of Science and Technology, Hong Kong
D09
Fabrication of cantilever arrays with tips for parallel optical readout
W.W. Koelmans1, T. Peters1, L. Abelmann1 and M.C. Elwenspoek1,2
1MESA+ and IMPACT Research Institutes, University of Twente, The Netherlands
2Freiburg institute for Advanced Studies, Albert-Ludwigs-Universitat Freiburg, Germany
D10
Morphological characterisation of micromachined film bulk acoustic resonator structures manufactured on GaN/Si
A. Cismaru1, A. Stavrinidis2, A. Stefanescu1, D. Neculoiu1, G. Konstantinidis2 and A. Müller1
1IMT-Bucharest, Romania
2FORTH-IESL-MRG Heraklion, Greece
D11
Static crack growth and fatigue modeling for silicon MEMS
W.M. van Spengen
TU Delft, 3mE-PME, The Netherlands
D12
Development of a novel micromirror with high static rotation angle for measurement applications
S. Weinberger, O. Jakovlev, C.H. Winkelmann, E. Markweg, T. Polster and M. Hoffmann
Ilmenau University of Technology, IMN MacroNano®, Department of Micromechanical Systems, Germany
D13
Applications of all-(111) surface silicon nanowires
M.N. Masood, S. Chen, E.T. Carlen and A. van den Berg
BIOS Lab on a Chip, MESA+ Institute for Nanotechnology, University of Twente, The Netherlands
D14
A micromirror for optical projection displays
R.A. Brookhuis1, M.J. de Boer1, M. Dijkstra1, A.A. Kuijpers2, D. van Lierop2 and R.J. Wiegerink1
1MESA+ institute for nanotechnology, University of Twente, The Netherlands
2Philips Applied Technologies, Eindhoven, The Netherlands
D15
Frequency shift of MEMS electromechanical resonators induced by process variation
F. Casset1, J. Arcamone1, A. Niel1, E. Lorent1, C. Marcoux1, Y. Civet3, C. Durand2, E. Ollier1, P. Renaux1, JF. Carpentier2, P. Ancey2 and P. Robert1
1CEA, LETI, MINATEC, France
2STMicroelectronics, France
3TIMA, CNRS, Grenoble INP, France
D16
Wet etching optimization for arbitrarily shaped planar electrode structures
H. Rattanasonti1, R.C. Sterling2, P. Srinivasan1, W.K. Hensinger2 and M. Kraft1
1School of Electronics and Computer Science, University of Southampton, UK
2Department of Physics and Astronomy, University of Sussex, UK
D17
Thermal behaviour of three dimensional single crystalline force sensors
G. Battistig1, T. Weidisch2, T. Retkes2, M. Ádám1, I. Bársony1 and T. Mohácsy1
1Research Institute for Technical Physics and Materials Science - MFA, Hungarian Academy of Sciences, Hungary
2Department of Electron Devices of the Budapest University of Technology and Economics, Hungary
D18
Incorporation of in-plane electrical interconnects to the reflow bonding
B. Mogulkoc1, H.V. Jansen1, H.J.M. ter Brake1 and M.C. Elwenspoek1,2
1MESA+ and IMPACT Research Institutes, University of Twente, The Netherlands
2Freiburg institute for Advanced Studies, Albert-Ludwigs-Universitat Freiburg, Germany
D19
Piezoelectric power harvesting device with multiple resonant frequencies
Z. Chew and L. Li
Swansea University, School of Engineering, UK
D20
Reliability modelling of MEMS cantilever switches under variable actuation stress levels
P. Fitzgerald1 and M. Hill2
1Cork Institute of Technology, Ireland and Analog Devices
2Cork Institute of Technology, Cork, Ireland