Marko Sturm presents as invited speaker on the 69th AVS

'Probing thin film interfaces at the nanoscale by Low Energy Ion Scattering'

Marko Sturm presented an invited talk titled ‘Probing thin film interfaces at the nanoscale by Low Energy Ion Scattering’ during the 69th International Symposium & Exhibition of the American Vacuum Society (AVS) in Portland, Oregon. In his presentation, he highlighted the work by former XUV PhD student Ani Chandrasekaran on using Low Energy Ion Scattering (LEIS) for studying the growth of ultrathin transition metal films, as well as the work of current XUV PhD student Adele Valpreda on using the LEIS tail signal for measuring sharpness of thin film interfaces.