MESA+ University of Twente
Industrial focus group XUV Optics

XUV

Master assignment

Analysis of XRD data from Y films.

Contact: dr. Igor Makhotkin (i.makhotkin@utwente.nl)

 The goal is to analyze the shape an parameters of XRD peaks fitting them with pseudo Voight function. The student will have to prepare a script for peak fitting and analyzed measured before XRD data sets.

The program should be able to fit overlap peaks. Potentially in case of successful and fast fitting of peaks a  size-strain calculation using Warren-Averbach method can be performed by the student.