MESA+ University of Twente
Industrial focus group XUV Optics

BSc - MSc assignments

contribution of second layer scattering in Low Energy Ion Scattering Low Energy Ion Scattering (LEIS) is a surface analysis technique almost exclusively sensitive to a topmost layer composition. Detecting hydrogen from the sputtered ion signal in low-energy ion scattering Low-energy ion scattering (LEIS) probes the outermost atomic layer of a surface by backscattering of noble gas ions. Synthesis of multilayer structures with atomic scale layer thickness This project aims for the development of multilayer systems for the use as spectroscopic elements. Flying circus spectrometer: A tool for understanding EUV light sources The XUV Optics group is undertaking an exciting spin-off project based on a newly developed optical component: a nanoscale patterned transmission grating that enables high resolution spectroscopy in the XUV wavelength range. Laser measurement of surface temperature. Fast local and fast measurements of temperature is useful tool for example in research of heat transfer, or temperature control of thin film deposition. Analysis of XRD data from Y films. The goal is to analyze the shape an parameters of XRD peaks fitting them with pseudo Voight function. Measurement and preliminary analysis of crystalline sizes in thin metallic films. To measure X-ray diffraction plots from various thin metallic films optimizing measurement conditions with the goal to select the best measurement scheme and determine the best measurement scheme and determine the instrumental function of different optical elements. In-house grazing incidence X-ray fluorescence spectroscopy In many fields of modern research scientists are dealing with thin films. No matter what field is explored, whether it is connected to optical coatings, thermoelectric, magnetic materials or bio-membranes, for understanding the thin film functional characteristics it is of vital importance to be able to characterise their internal structure. Development of X-ray reflectivity for thin film and multilayer structures X-Ray reflectivity (XRR) is one of the most useful characterization techniques for thin films and multilayers.