MESA+ University of Twente
Industrial focus group XUV Optics

XUV

Master assignment

Laser measurement of surface temperature.

Contact: dr. I. Makhotkin (i.makhotkin@utwente.nl)

Fast local and fast measurements of temperature is useful tool for example in research of heat transfer, or temperature control of thin film deposition. For applications where standard tools like thermo couples often cannot be applied because of low measurement speed the laser based temperature measurement can be applied. Physics behind this measurement scheme is based on the temperature dependence of the reflective coefficient of thin films. Therefore measuring the reflectance of laser light we will be able to determine the temperature of the film. The task for this project is based on existing knowledge to design, assemble and test laser based reflectometer, that is adapted for ultra-sensitive measurements of changes of intensity of reflected from thin film reflected light (code IM).