MESA+ University of Twente
Industrial focus group XUV Optics

XUV

Bachelor assignment

Contribution of second layer scattering in Low Energy Ion Scattering

Contact: Andrey Zameshin (a.zameshin@utwente.nl)

Low Energy Ion Scattering (LEIS) is a surface analysis technique almost exclusively sensitive to a topmost layer composition. We recently found out that in a rare selection of materials a contribution of second layer scattering is pronounced. This effect was observed before for very “open” crystal planes with low atomic density, but in our case the explanation is completely different and much more interesting. We believe it is connected to a high ion survival fraction in the material. To properly justify our theory ion fraction has to be measured on a number of different surfaces, composed of different elements. This is mostly a pure experimental task, which involves a healthy amount of challenge of systematically collecting LEIS spectra for different ion energies for every given surface. We expect that the data obtained in this bachelor project will be the experimental basis of a paper we plan to publish on this topic. Bachelor students are welcome to participate in the paper.