Analysis

Facilities

surface analysis, imaging and sample CREATION

FIB: FEI NOVA 600 dual beam Focused Ion Beam

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SEM: ZEISS MERLIN scanning electron microscope  

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TEM: PHILIPS CM300ST-FEG  analytical Transmission Electron Microscope 300 kV

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XPS: PHYSICAL ELECTRONICS PHI Quantera SXM - XPS system 

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In our sample preparation room there are several machines that can be used to change your samples into samples that can be used in the above machines.

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