Analysis

Facilities

surface analysis, imaging and sample CREATION

FIB: FEI NOVA 600 dual beam Focused Ion Beam


 SEM: ZEISS MERLIN scanning electron microscope  


 TEM: PHILIPS CM300ST-FEG  analytical Transmission Electron Microscope 300 kV

 XPS: PHYSICAL ELECTRONICS PHI Quantera SXM - XPS system 



In our sample preparation room there are several machines that can be used to change your samples into samples that can be used in the above machines.