FIB: FEI NOVA 600 dual beam Focused Ion Beam
SEM: ZEISS MERLIN scanning electron microscope
TEM: PHILIPS CM300ST-FEG analytical Transmission Electron Microscope 300 kV
XPS: PHYSICAL ELECTRONICS PHI Quantera SXM - XPS system
In our sample preparation room there are several machines that can be used to change your samples into samples that can be used in the above machines.