MESA+ University of Twente
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MESA+ Spin offs

Electron Microscopy services and consulting like SEM, TEM and FIB analysis. We are experts in advanced TEM sample preparation, FIB cross-sectioning, Circuit edit. Material analysis like EDX, XPS, ToF-SIMS, FTIR can be provided as well. We serve R&D departments of high-tech companies regarding Failure Analysis, Competitor Analysis, Patent Infringements, Quality Control and Surface Analysis for the Semiconductor, Automotive and Nanotechnology industries.

We offer an Integral Solution providing the most appropriate analysis in one package and one invoice.


TEM sample preparation, SEM, TEM & FIB services & consulting, Material Analysis like EDX, ToF-SIMS, FTIR, Raman, XPS, Failure Analysis, Surface Analysis and Contamination Analysis

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