Thesis assignments

Measurement and preliminary analysis of crystalline sizes in thin metallic films

assignment

Measurement and preliminary analysis of crystalline sizes in thin metallic films.
Contact: Dr. ir. Robbert van de Kruijs (r.w.e.vandekruijs@utwente.nl)

To measure X-ray diffraction plots from various thin metallic films optimizing measurement conditions with the goal to select the best measurement scheme and determine the best measurement scheme and determine the instrumental function of different optical elements.