Analysis of XRD data from Y films.
Contact: Dr. ir. Robbert van de Kruijs (email@example.com)
The goal is to analyze the shape an parameters of XRD peaks fitting them with pseudo Voight function. The student will have to prepare a script for peak fitting and analyzed measured before XRD data sets.
The program should be able to fit overlap peaks. Potentially in case of successful and fast fitting of peaks a size-strain calculation using Warren-Averbach method can be performed by the student.