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Analysis of XRD data from Y films


Analysis of XRD data from Y films.
Contact: Dr. ir. Robbert van de Kruijs (

 The goal is to analyze the shape an parameters of XRD peaks fitting them with pseudo Voight function. The student will have to prepare a script for peak fitting and analyzed measured before XRD data sets.
The program should be able to fit overlap peaks. Potentially in case of successful and fast fitting of peaks a  size-strain calculation using Warren-Averbach method can be performed by the student.