XPS

PHI Quantes Dual Scanning X-ray Photoelectron Microprobe

PHI Quantes Dual Scanning X-ray Photoelectron Microprobe is the new XPS at MESA+ NanoLab. It is a unique dual monochromator scanning X-ray Photoelectron microprobe that combines a high energy (HAXPES) monochromatic x-ray source (Cr Kα) with a conventional monochromatic soft x-ray (Al Kα). This state-of-the-art XPS instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. With a dual-source ion gun it can be used for gentle surface cleaning as well as depth profiling with little to no chemical damage for inorganic and organic materials.


CONTACT: 

Picture of dr. Y. Bu (Yibin)
dr. Y. Bu (Yibin) Operator XPS/HAXPES
+31534899599
 y.bu@utwente.nl
Building: Nanolab 1001
Personal page

YOU CAN FIND THE XPS IN NANOLAB NL1.029


Additional Information

Applications
XPS explained

How does it work, an introduction

Surface composition

One of the most used applications for XPS is the measurement of the elemental composition  of the surface of a material

Element mapping

With a scanning XPS it is possible to map the composition of structured surfaces

Depth profiling

An argon gun facilitates removal of atoms from the surface, generating sputter craters of which the fresh surface can be determined again. This results in a depth profile

Chemical bonds

As each atom in a solid is bound with several neighbours there will be a shift in the electron energy shells due to these bindings. XPS will show these shifts

 
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