Scanning probe microscopy (SPM) techniques allow imaging of nanoscale surfaces and structures with atomic resolution based on various principles. They all make use of a physical probe to scan an area of a sample surface. During scanning, data are collected by a computer to generate an image of the surface, visualizing its nanoscale structure. Additionally some types of SPMs can be used as a manipulation tool to move individual atoms for creating specific patterns. In contrast to optical microscopy, SPM is a blind technique. Instead of using light for imaging, SPM uses a probe for sensing specific surface characteristics, like topography or material properties, to represent them in an image.


Among the SPM techniques, atomic force microscopy (AFM) is based on measurement of electrostatic forces between the cantilever tip and the sample surface and magnetic force microscopy (MFM) measures magnetic tip-sample interaction forces. In scanning tunneling microscopy (STM), the electrical current flowing between the cantilever tip and the sample is measured. In general, AFM is used to study non-conductive materials like macromolecules.

PM techniques available at MAC-Twente:

  • AFM (FastScan)

AFM

AFM

Robert Wijn

r.r.wijn@utwente.nl

+31-53-489-6770





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