A microscope is an optical system to create a magnified image of a subject. By using electrons instead of light much higher magnifications can be achieved. Transmission Electron Microscopy (TEM) allows you to explore the internal structure of a thin (solid) specimen, where access is given to micro- and nanostructure details. High vacuum is the minimum requirement for the execution of electron microscopy.
TEM specimen preparation, an introduction
Specimen preparation aspects of samples, composed of materials with very different properties, for cross-sectional TEM (XTEM) observation. Example: Dimple Grinding/Polishing and Argon ion milling as applied to a brittle magnetic thin film on a flexible plastic tape.
XTEM analysis of porous anodic aluminium oxide films with columnar structure.
Observation of blisters; the importance of specimen thickness to allow XTEM viewing of the fully intact hemispherical blister dome.
Large field-of-view XTEM analysis of piezoelectric material. Challenging or piece of a cake? In this example is shown how the method of Dimple Grinding/Polishing and Argon ion etching compares with Focused Ion Beam to prepare specimens composed of a very thick film of piezoelectric material, several micrometers thick, on an electrically non-conductive substrate.
Energy-filteredTEM
Damage control in FIB; A TEM study