The Philips X’Pert 1 X-ray diffractometer is a versatile device to characterise crystalline materials. It is capable of performing various types of measurements and analyses. The diffractometer has a stationary, centrally placed, X-ray tube with (para focusing) line focus and (parallel beam) point focus employing two goniometers for each type of focus. The line focus is mainly used for general diffraction work and phase analysis. Furthermore, it is used for determination of stresses in (sub) surface layers and line profile analysis. The point focus is mainly used for texture measurements. All measurements are done at room temperature. An oven is available to perform measurements at elevated temperatures under gas protection if required.


X-ray diffraction, stress analysis, texture analysis, line profile analysis


General Bragg Brentano scans, stress measurements, texture measurements


X-ray tube (Co, but others at request): line focus and point focus

Line focus

Goniometer (0 – 160 °2θ, min step size 0.005 °2θ)

Fixed divergence and anti-scatter slits (1/32, 1/16, 1/8, 1/4 , 1/2, 1, 2, 4° )

Fixed receiving slits (0.1, 0.2, 0.3 mm)

Incident beam filter (tube dependent, no diffracted beam monochromator)

Incident beam mask (2, 5, 10, 15, 20 mm)

Gas filled proportional detector

Point focus

Goniometer (0 – 150 °2θ, min step size 0.005 °2θ)

Eulerian cradle (0 < ψ < 90 degrees, 0 < φ < 360 degrees)

Parallel plate collimator (0.27 rad)

Manual collimator slit

Ø 2mm quasi parallel incident beam opening.

Gas filled proportional detector


X’pert 1 diffractometer with stationary tube and double goniometer system for point and line focus. All measurements are computer controlled. Measurements can be pre-programmed and run consecutively. Data analysis with various dedicated software programs.Several types of samples can be measured.



Westhorst WH121

Research group:

Production Technology


Ton Bor