Boni Boksteen, Alessandro Ferrara

In contrast to low power devices high voltage power devices are not optimized for speed or battery life but for their output power, making them inherently subject to extreme operating conditions. Since a small degradation in one of these transistor parameters can lead to serious degradation of device performance or even complete system failure robust device design is of the utmost importance.
The HV-reliability project’s goal is therefore to identify the interaction between the time-zero performance and device degradation, leading to the creation of accelerated lifetime tests and reliability models. This should ultimately result in technology- and/or design guidelines that can be used by our industrial partner (NXP) to create smaller power-devices without reliability risks.