Faculty: Electrical Engineering, Mathematics and Computer Science
Address: Carré 2.617
P.O. Box 217
7500 AE Enschede, The Netherlands
Phone: +31 53 489 5767
Secretary: +31 53 489 3879
Function: Full professor
Jurriaan Schmitz was born in Elst, The Netherlands in 1967. He received his M.Sc. (1990, cum laude) and Ph.D. (1994) degrees in Experimental Physics at the University of Amsterdam on research carried out at the Nikhef research institute. In 1990 he was a CERN Summer Student. His research work was on new detectors for tracking and energy measurement of high-energy particles, the so-called MSGC and Spaghetti Calorimeter detectors. In this period he proposed the Micro Trench Gas Counter, employing constant-field rather than radial-field gas amplification, and the DME/CO2 gas mixture for miniaturized gaseous detectors.
After his Ph.D. he joined Philips Research as a Senior Scientist (1994-2002), studying CMOS transistor scaling, characterization and reliability. He worked on CMOS transistors from the 0,25 µm to the 90-nm node, studying super-steep retrograde wells, halo (pocket) implants, shallow junctions, GeSi gates, gate depletion and gate-last fabrication. Later he concentrated on characterization and reliability of CMOS devices, and studied the measurement issues arising from excessive gate leakage. He proposed the RF-CV characterization technique. He patented several new transistor architectures as well as inventions related to embedded flash memories and CMOS-APS image sensors.
In 2002 he became full professor at the University of Twente as the successor of Prof. Hans Wallinga. He expanded his research interests to include above-IC technologies and light-from-silicon. With his coworkers and PhD students he worked on a variety of topics such as energy harvesting microchips, radiation imaging detectors on CMOS, and RF-CMOS and RF-MEMS reliability. He currently heads a research group of 25 people and supervises 10 Ph.D. students.
He is technical program committee member of the European Solid-State Device Research Conference (ESSDERC). He acted as Technical Program Chair of the 2008 IEEE International Conference on Microelectronic Test Structures (ICMTS) and General Chairman of the same conference in 2011. He took part in the IEEE IEDM conference organization for 8 years total, including European Arrangements Co-Chair in 2012-2013. He served as board member of the Dutch Physical Society (NNV) and chaired the IEEE EDS chapter Benelux. He is a member of the Program Council of the Materials Innovation Institute (M2i).
Prof. Schmitz authored or co-authored over 200 journal and conference papers, 18 patents, and three book chapters. He acts as Editor of IEEE Electron Device Letters.