On March 28th, Svetlana van Nieuwkasteele-Bystrova presented her latest results at the 30th IEEE International Conference on Microelectronic Test Structures (ICMTS) held at MINATEC campus in Grenoble, France. Her oral presentation was on the improved methodology of electrical measurements for contact resistivity extraction in solar cells. Svetlana is a postdoc in the ADEM research programme, partially funded by the Dutch Ministry of Economic Affairs. She works on studying the benefit of newly developed thin-film techniques, originally designed for integrated-circuit manufacturing, in increasing the efficiency of photovoltaic (solar) cells.
At the same conference and being the next speaker after Svetlana, Sourish Banerjee presented electrical test structures for verifying continuity of ultra-thin insulating and conducting films. Sourish is a PhD student in the STW-funded project “Towards polycrystalline GaN/AlGaN devices in silicon technology”. He investigates the fabrication and properties of polycrystalline GaN and aluminum-gallium-nitride (AlGaN) materials for applications in semiconductor devices.
