Atomic Force Microscope (AFM) NanoSurf easyScan 2
•The Nanosurf easyScan 2 AFM system is an atomic force microscope that can measure the topography and several other properties of a sample with nanometer resolution. The main parts of the basic system are the easyScan 2 AFM Scan Head, the AFM sample stage, the controller with AFM basic module and the easyScan 2 software.
•Dual lens observation optics and automatic approach that are ideal for nanotechnology education and outreach
•Cantilever Alignment Chip technology that allows simple and quick tip exchange without any laser adjustments
AFM, atomic force microscopy, surface topography, surface roughness
Micrography, topography, analysis of thin films or coatings, defects, roughness.
Westhorst WH 121
Laura Vargas (L.D.Vargas-Llona@ctw.utwente.nl)