NeoScope JCM-5000 benchtop Scanning Electron Microscope (SEM)
•Easy to use: digital camera-looking interface
•Anyone can learn to use it in 30 min, even a beginner.
•Image in three minutes after loading specimen
•Coating not always necessary due to low vacuum observation mode.
•Dimensions of main unit: 492 mm(width )x 458 mm (depth) x 434 mm (height), 63 kg
Metal fracture surface
Cross section composite material with glass fibers in epoxy
Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects..
•A real magnification range of 10X-20,000X
•High vacuum and low vacuum modes
•3 different kV presets (5, 10, 15 kV)
•Sample stage allows 35 mm travel in X and Y
•Maximum sample size 70 mm diameter and 50 mm thickness
Secondary and back-scatter imaging modes
Westhorst WH 121
Laura Vargas (L.D.Vargas-Llona@ctw.utwente.nl)