The series of analysis equipment is meant at providing tools to characterise and measure physical properties and behaviour of materials. They also support various activities as modeling, process experiments, mechanical testing.
They include micrography facilities (stereo microscopes, Light microscopes, electron microscope), thermo-mechanical analysis, stress measurement…
The analysis lab is also supported by a fully equipped preparation lab.
Here follows a description of the main analysis equipment.
Jeol NeoScope JCM-5000 Benchtop Scanning Electron Microscope
The Jeol Neoscope JCM-5000 is the 'easy to use' benchtop SEM.
Jeol JSM 6400 Scanning Electron Microscope
The Jeol JSM-6400 is a SEM configured with a Noran energy dispersive X-ray analyzer (EDS system). SEM is a method for high-resolution imaging of surfaces. An incident electron beam is scanned across the sample’s surface, and the resulting electrons emitted from the sample are attracted and collected by a detector and translated into a signal.
Atomic Force Microscope (AFM) NanoSurf easyScan 2
The Nanosurf easyScan 2 AFM system is an atomic force microscope that can measure the topography and several other properties of a sample with nanometer resolution. The main parts of the basic system are the easyScan 2 AFM Scan Head, the AFM sample stage, the controller with AFM basic module and the easyScan 2 software.
Stereo Microscope Leica MZ 125
The stereo microscope uses two separate optical paths with two objectives and two eyepieces to provide slightly different viewing angles to the left and right eyes. In this way it produces a three-dimensional visualization of the sample being examined. A stereo microscope has a useful magnification up to 100×.
Optical microscope Leica DMRX
The Leica DMRX is an upright microscope for material analysis equipped with a wide range of objective lenses. It can be used for bright field, dark field, DIC and fluorescence. Two filter blocks are available for fluorescence. A digital color camera (c-mount) is attached to the system.
Laser scanning microscope VK 9700 Keyence
Confocal laser scanning microscopy is a powerful tool for high resolution imaging. In conventional light microscopy, both focused and out-of focus light contributes to the image. In confocal microscopy, all structures outside the focal plane of the microscope objective are suppressed. As a result, images of that single focal plane are sharp and less blurred that in wide-field microscopy.
Philips X'Pert 1 X-ray Diffractometer
The Philips X’Pert 1 X-ray diffractometer is a versatile device to characterise crystalline materials. It is capable of performing various types of measurements and analyses. The diffractometer has a stationary, centrally placed, X-ray tube with (para focusing) line focus and (parallel beam) point focus employing two goniometers for each type of focus.
Mettler Differential Scanning Calorimeter (DSC822E)
The Mettler Toledo Differential Scanning Calorimeter (DSC) measures the difference between the heat flows from the sample and reference sides of a sensor as a function of temperature or time. Differences in heat flow arise when a sample absorbs or releases heat due to thermal effects such as melting, crystallization, chemical reactions, polymorphic transitions…
Mettler Analytical Balance & Density Measurement (AT261)
The Mettler Toledo Analytical balance AT261 measures mass with a 0.05mg repeatability. It also features an density determination kit, both for solids and liquids.