Research Engineer

Ing. Louise Vrielink

Faculty of Science & Technology

University of Twente, PO Box 217

7500 AE, Enschede

The Netherlands

Telephone: +31-53-489 2908 / 3033

Fax: +31-53-489 4683

e-mail:J.A.M.Vrielink@utwente.nl

Techniques

▪ XRF

▪ BET

▪ xrfcombi

Posters▪ 
Analyzing the concentration of nobleelements in catalysts using XRF (Poster N3C, 2011)
▪ 
X-ray fluorescence spectroscopy as method to determine the thickness and composition of metal thin films
▪ 
XRF in catalysis (OSPT)
▪ 
An efficient quantitative XRF analysis
▪ 
Analyzing the concentration of Potassium in Yttrium Stabilized Zirconium in presence of Platinum.
▪ 
Analyzing the concentration of noble elements in catalysts using XRF

More info

▪ Applicability of X-ray fluorescence spectroscopy as method to determine thickness and composition of stacks of metal thin films: A comparison with imaging and profilometry

▪ List of Group Publications

Colloquia

▪ Practical X-ray spectroscopy

▪ XRF as a method to determine thickness and composition of thin films in multi-layers

▪ BET: a practical approach