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ARAMIS is an Optical Deformation and Strain Measurement System, which is an optical technique used to measure the deformation and strain of the surface of an object before and after loading. ARAMIS recognizes the surface structure of the measuring object in digital camera images and allocates coordinates to the image pixels. To enhance the image analysis, a random speckle pattern is applied using a spray paint. ... read more |
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Jeol JSM 6400 Scanning Electron Microscope The Jeol JSM-6400 is a SEM configured with a Noran energy dispersive X-ray analyzer (EDS system). SEM is a method for high-resolution imaging of surfaces. ... read more |
Experiments that measure material properties contactless. The adventage is that the material sample will not be damaged.

